LAMBDA Series Terahertz Probe
Terahertz probe is the core interface device for on-wafer / on-chip RF testing in terahertz frequency band. It connects Vector Network Analyzer (VNA), signal generator and Device Under Test (DUT). It enables accurate measurement of S-parameters and radiation characteristics of active/passive devices, on-chip antennas and terahertz integrated circuits at wafer level before packaging, covering 75GHz~330GHz and higher frequency bands. It serves as a domestic alternative to imported high-frequency probes, widely adopted by university laboratories, research institutes and RF semiconductor enterprises.
Product Specification
Dual-Band Probes
|
Frequency (GHz) |
Tip Type |
Recommended Pitch (μm) |
Connector Type |
|
DC-170 |
GSG |
75~125 |
WR-6 Waveguide + 1.0mm Coaxial |
|
DC-220 |
GSG |
75~125 |
WR-5 Waveguide + 1.0/0.8mm Coaxial |
Ultra-Wideband Coaxial Probes
|
Frequency (GHz) |
Tip Type |
Recommended Pitch (μm) |
Connector Type |
|
DC-110/145GHz |
GSG |
50~200 |
1.0/0.8mm Coaxial |
|
GSGSG |
50~150 |
||
|
GSSG |
50~150 |
||
|
DC-175/220GHz |
GSG |
50~150 |
0.6mm Coaxial |
|
GSGSG |
50~125 |
||
|
GSSG |
50~125 |
Product Selection Guide
|
Frequency Band (GHz) |
Recommended Pitch (μm) |
Test Functions |
|
|
Standard Probe |
Cryogenic Probe |
||
|
DC-110 |
50~250 |
√ |
/ |
|
DC-145 |
50~150 |
√ |
/ |
|
DC-220 |
50~100 |
√ |
/ |
|
75~110 |
100~150，250 |
√ |
√ |
|
90~140 |
50~100 |
√ |
√ |
|
110~220 |
100~150 |
√ |
√ |
|
170~260 |
50~150 |
√ |
√ |
|
220~330 |
50~100 |
√ |
√ |
|
260~400 |
50 |
√ |
Customizable |
|
350~500 |
50 |
√ |
Customizable |
*Customization is available upon customer demand.
Measured Performance Curves
|
75~110GHz GSG Probe Test Data |
110~170GHz GSG Probe Test Data |
|
170~260GHz GSG Probe Test Data |
220~330GHz GSG Probe Test Data |
|
140GHz~220GHz GSGSG/GSSG Probe Test Data |
|
