LAMBDA Series Separating Waveguide Resonator Dielectric Measurement System
Applications
This system operates in the TE10 mode. It measures the resonant frequency and 3dB bandwidth of the sample-loaded cavity and empty cavity to calculate the quality factor Q. An iterative algorithm is then used to determine the equivalent air-gap length of the empty cavity as the measurement reference. The dielectric constant ε’ is solved from the transcendental equation using the zero-crossing method. The system adopts a micron-level sample clamping structure for non-destructive clamping and positioning of thin sheet materials, making it especially suitable for accurate measurement of film materials. It overcomes the operational limitations of traditional methods, simplifies procedures, and ensures high test accuracy.
Product Features
· Unified sample size: 4×4 cm², thickness 0.1~4 mm; standardized preparation with high versatility.
· Testable dielectric loss: 0.0001~0.1, covering both ultra-low-loss and medium-loss materials for wider applications.
· Open-close waveguide structure for easy sample loading; excellent cavity shielding and high test stability.
· Test accuracy: dielectric constant 1%, loss 3%, meeting high-precision requirements for research and industry.
· Single-frequency rapid test; automatic calculation by software with complete test report output.
Specifications
Test frequency: 10 GHz (single point); customizable
Test range: dielectric constant 1~100; dielectric loss 0.0001~0.1
Test accuracy: dielectric constant 1%, loss 3%
Sample requirement: solid sliced sample, size 4×4 cm², flat surface, thickness 0.1 mm~4 mm
Physical Photo of Test Equipment
Software System
