LAMBDA Series Closed Resonant Dielectric Measurement System
Applications
This system performs measurements based on electromagnetic field resonance, the most accurate method for low‑loss material testing. By measuring the resonant frequency shift Δf and quality factor Q change before and after sample placement using a vector network analyzer, it obtains an accurate solution for the complex permittivity of dielectric materials through rigorous electromagnetic field analysis. This method delivers extremely high testing precision, especially suitable for ultra‑low‑loss dielectric materials, and is widely used in high‑end electronic materials, microwave dielectrics, aerospace wave‑transparent materials, precision scientific research characterization, and other fields.
Product Features
· Dielectric constant accuracy up to 0.2%, loss accuracy 1%~3%, far exceeding the transmission line method; ideal for ultra‑low‑loss materials.
· Specially designed for high‑frequency dielectrics with extremely low tanδ, compensating for the low‑precision limitation of broadband transmission line methods in the low‑loss region.
· Closed metal cavity provides strong shielding, high anti‑interference capability, and high test result repeatability.
· Single‑frequency point measurement with simple workflow; software automatically calculates and outputs high‑precision results.
Specifications
Test frequency: 5 GHz (single point); customizable
Test range: dielectric constant 1~100; dielectric loss 0.00005~0.005
Test accuracy: dielectric constant 0.2%~1%; loss 1%~3%
Sample requirement: sample length/width/diameter = 0.2~0.8 times the corresponding cavity dimension
Physical Photo of Test Equipment
Software System
