LAMBDA Series Separating Medium Resonant Dielectric Measurement System
Applications
Based on electromagnetic resonance characteristics, this system adopts a vector network analyzer to measure resonant frequency shift △f and Q-factor variation before and after sample loading. Accurate complex permittivity of dielectrics is derived via rigorous electromagnetic field analysis. It is widely used to measure permittivity and loss of planar dielectric materials at high microwave frequencies, including LTCC, HTCC, AlN, various microwave ceramic substrates and common PCB boards.
Product Features
· Permittivity accuracy up to 5%, loss accuracy 1%~3%, superior to transmission line method and ideal for ultra-low-loss materials.
· Optimized for high-frequency dielectrics with ultra-small tanδ, compensating poor accuracy of broadband transmission line method at low-loss range.
· Sealed metal cavity provides excellent shielding against external interference with outstanding test repeatability.
· Single-frequency measurement with streamlined workflow; software automatically calculates and exports precise results.
Specifications
Test frequency: 10 GHz (single fixed frequency, customizable)
Test range: Permittivity 1~100; Dielectric loss 0.0001~0.001
Measurement accuracy: Permittivity ±5%
Sample requirement: Length 50~100 mm, width 20~50 mm, thickness ＜1 mm
Physical Photo of Test Equipment
Software System
