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时间:2024/04/17
Applications
General Antenna Testing, Metasurface Testing, Phased Array Diagnosis, Radar Testing, etc.
Capabilities
LAMBDA Series Hybrid Field Test System supports Planar Near-Field, Cylindrical Near-Field and Far-Field Testing.
The system test function depends on the specific requirements of the user. Our test system supports the customization of microwave anechoic chamber dimension and operating frequency range.
·Support a variety of passive and active antenna test requirements.
·Fast testing near-field patterns of amplitude and phase, far-field patterns and holographic patterns.
·Easy to upgrade for cylindrical or spherical near-field measurements.
·Support data export files: antenna gain, 2D/3D radiation patterns, beam pointing and cross polarization.
Specifications
Frequency: 1GHz ~ 110GHz (up to 500GHz upon request)
Drive System: Precision Stepper Motor; Servo Motor; Rack and Pinion
Scan Aera: 0.3m×0.3m ~1.5m×1.5m (larger scan area can be customized)
Planarity: 0.05mm ~ 0.125mm RMS (cylindrical near-field available)
Position Repeatability: 0.05mm RMS
Scan Speed (X-Y Axis): X (0.2 ~ 1m/s); Y (0.2 ~ 1m/s)
RF Cables: High Performance Stable Amplitude and Phase Cables (up to 110GHz)
Probe: Standard Rectangular Waveguide Probe (up to 110GHz)
Probe Mount: Custom Bracket – Allows “V” and “H” Polarization
Supply Power: 100 ~ 240V AC Switchable; 50 / 60Hz, 500 Watts
Supported RF Instrument: Keysight, Rohde & Schwarz, Anritsu, Ceyear, etc.
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System Configuration
·Customized Microwave Anechoic Chamber
·X-Y Stepper / Servo Motor Driven Scanner
·Motor System and Controller Kit
·PC Workstation
·Antenna Measurement Software
·Installation Tool Kits
·Optional Components: LNA, PA, RF Cables
·Test Instruments (Vector Network Analyzer, Signal Generator / Spectrum Analyzer)
·Probes
·System Documentation and Operation Manual
Optional Configuration
Magpie Test System (Near-Field & Far-Field) Silkworm Test System (Near-Field & Far-Field)
THz Test System (Near-Field & Far-Field) Spider Test System (Near-Field)
Software System
·Near-Field Test System
Export 2D/3D radiation patterns.
·Far-Field Test System
Fast 2D radiation pattern export.